[1] [1] S E Voribeichikov, V A Vdod, V Aklimenov, et al.. An algorithm for the automatic detection of inclusions in an inspected object with a scanning digital X-ray imaging system (one-dimensional variant)[J]. Russian Journal of Nondestructive Testing, 2014, 50(6): 359-368.

[2] [2] Qiao Naosheng, Zhang Fen, Li Xiaoqin. Defect image preprocessing of printed circuit board[J]. Laser & Optoelectronics Progress, 2015, 52(2): 021003.

[3] [3] Jing Feng. X-ray imaging system used in non-destructive testing[J]. Aerospace Manufacturing Technology, 2004, 2: 21-23.

[4] [4] Liu Niancong, Fang Fang. Research X-ray imaging system NDT[J]. Lifting the Transport Machinery, 2009, 4: 67-70.

[5] [5] Ji Guiqin, Wang Yan, Liu Bosen. Application of X-ray real time imaging system to industrial nondestructive testing[J]. Journal of Heilongjiang Institute of Teacnology, 2014, 28(4): 47-50.

[6] [6] S S Young, R G Driggers. Super-resolution image reconstruction from aliased FLIR imagery[J]. Army Research Lab Adelphi MD, 2004: A431600.

[7] [7] Chen Jian, Gao Huibin, WangWeiguo, et al.. Methods and applications of image super-esolution restoration[J]. Laser & Optoelectronics Progress, 2015, 52(2): 020004.

[8] [8] S Hwang, Y Choi, S Koo. Shape reconstruction and inspection using multi-planar X-ray images[J]. International Journal of Precision Enginerting and Manufacturing, 2014, 15(8): 1545-1551.

[9] [9] Li Jun, Peng Yuemin, Fan Zhihua. A survey of sub-pixel image registration methods[J]. Journal of Image and Graphics, 2008, 13(11): 2070-2075.

[10] [10] Li Yapeng, He Bin. Improving image quality by using CCD subpixel imaging[J]. Acta Optical Sinica, 2015, 35(2): 0211001.

[11] [11] J M Wiltse, J L Miller. Imagery improvements in staring infrared imagers by employing subpixel microscan[J]. Optical Engineering, 2005, 44( 5): 056401.

[12] [12] Wu Xinshe, Cai Yi. The optical micro scan technology in the infrared staring imaging system[J]. Journal of Infrared and Millimeter Waves, 2007, 26(1): 10-14.

[13] [13] Chen Weili, Xu Chao, Jin Weiqi, et al.. Finite element analysis and optical micro-scanner based on ferroelectric ceramics[J]. Transactions of Beijing Institute of Technology, 2008, 28(11): 1003-1007.

[14] [14] M Gao, W Xu, W Wu, et al.. Optical microscanning X-ray real-time imaging system[C]. International Conference on Mechatronics, Electronic, Industrial and Control Engineering, 2014: 1134-1138.

[15] [15] Zhang Haitao, Zhao Dazun. Mathematics theory and realization of aliasing reduction in opto-electric imaging system using micro-scanning[J]. Acta Optica Sinica, 1999, 19(9): 1263-1268.

[16] [16] Gao Meijing, Gu Haihua, Guan Congrong, et al.. Adaptive position calibration for thermal microscope imaging system[J]. Acta Optical Sinica, 2013, 33(1): 0111002.

[17] [17] Gao Meijing. Investigation of high resolution optical micro-scanning thermal microscope imaging system[D]. Beijing: Beijing Institute of Technology, 2008: 11-21.