Optoelectronics Letters, Volume. 20, Issue 9, 560(2024)

Defect detection of light guide plate based on improved YOLOv5 networks

Ming XIAO1... Yefei GONG2,*, Hongding WANG3, Mingli LU2 and Hua and GAO4 |Show fewer author(s)
Author Affiliations
  • 1School of Electrical Engineering, Yancheng Institute of Technology, Yancheng 224007, China
  • 2School of Electrical and Automation Engineering, Changshu Institute of Technology, Changshu 215500, China
  • 3School of Physics and Electronic Engineering, Northeast Petroleum University, Daqing 163318, China
  • 4Wuxi Novo Automation Technology Corporation, Wuxi 214000, China
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    XIAO Ming, GONG Yefei, WANG Hongding, LU Mingli, and GAO Hua. Defect detection of light guide plate based on improved YOLOv5 networks[J]. Optoelectronics Letters, 2024, 20(9): 560

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    Paper Information

    Received: Aug. 4, 2023

    Accepted: Apr. 10, 2024

    Published Online: Sep. 2, 2024

    The Author Email: Yefei GONG (gong_yf@cslg.edu.cn)

    DOI:10.1007/s11801-024-3154-x

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