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Acta Photonica Sinica, Volume. 33, Issue 10, 1277(2004)

The Corrected Research of Flat-panel Detector Imaging System

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    [1] [1] Hoheisel M,Arques M,Chaussat J,et al.Amorphous silicon X-ray detectors.Journal of Non-crystalline Solids,1998.230(Part B):1300～1305

    [2] [2] VARIAN Company. PaxScan 2520 SysSvc2.book American:2000.10

    [3] [3] Moy J P,Bosset B.How does real offset and gain correction affect the DQE in images from X-ray Flat detectors.Part of the SPIE Conference on Physics of Medical Imagin,San Diego. California. February 1999,3659:90～97

    [5] [5] Kenneth R, Cast leman.Digital Image Processing.Beijing: Tsinghua University Press, 1998

    CLP Journals

    [1] LI Wei, ZHAO Bao-sheng, ZHAO Fei-fei, CAO Xi-bin. Analysis and Correction for Nonuniformity of the Two Side Proximity of X-ray Image Intensifier Radiography[J]. Acta Photonica Sinica, 2009, 38(6): 1353

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    [in Chinese], [in Chinese]. The Corrected Research of Flat-panel Detector Imaging System[J]. Acta Photonica Sinica, 2004, 33(10): 1277

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    Paper Information

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    Received: Sep. 16, 2003

    Accepted: --

    Published Online: Sep. 17, 2007

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    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology