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Spectroscopy and Spectral Analysis, Volume. 31, Issue 6, 1712(2011)

Boundary Threshold Value Method Used in Crystalline Material Internal Defect Detection by Short Wavelength X-Ray Diffraction

MU Jian-lei1、*, ZHANG Jin1, GAO Zheng-huan1, ZHENG Lin2, and HE Chang-guang2
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  • 2[in Chinese]
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    MU Jian-lei, ZHANG Jin, GAO Zheng-huan, ZHENG Lin, HE Chang-guang. Boundary Threshold Value Method Used in Crystalline Material Internal Defect Detection by Short Wavelength X-Ray Diffraction[J]. Spectroscopy and Spectral Analysis, 2011, 31(6): 1712

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    Paper Information

    Received: Sep. 7, 2010

    Accepted: --

    Published Online: Jan. 5, 2012

    The Author Email: Jian-lei MU (mujianlei725@126.com)

    DOI:10.3964/j.issn.1000-0593(2011)06-1712-05

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology