Optics and Precision Engineering, Volume. 32, Issue 17, 2625(2024)

White-light interferometry immune to vibration disturbance over wide frequency region

Qian LIU*... Le MI and Xiaojin HUANG |Show fewer author(s)
Author Affiliations
  • Institute of Machinery Manufacturing Technology, China Academy of Engineering Physics, Mianyang621999, China
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    Figures & Tables(14)
    Flowchart of three-point arcsine algorithm
    Sketch of calculating scannig increment
    Scanning increment calculation error with linear disturbance
    Scanning increment calculation error with sinusoidal disturbance
    Scanning increment calculation error with random disturbance
    Calculated scanning increment with 3P-Asin algorithm
    Residual errors of reconstructed topography of step
    Captured one interferogram of measuring step
    Calculated scanning increment
    Measured profiles of step (Insets are enlarged profiles circled with dashed lines)
    Measured step heights
    Diverse surface reconstructed with 3P-Asin algorithm
    Measured step heights under sinusoidal disturbances with different amplitudes
    • Table 1. RMSE of scanning increment calculation with different disturbances

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      Table 1. RMSE of scanning increment calculation with different disturbances

      MethodLinearSinusoidalRandom
      +50% error-50% errorLow frequencyHigh frequency
      3P-Asin0.0500.0500.0751.96.3
      Six-point0.1700.4600.2209.27.4
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    Qian LIU, Le MI, Xiaojin HUANG. White-light interferometry immune to vibration disturbance over wide frequency region[J]. Optics and Precision Engineering, 2024, 32(17): 2625

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    Paper Information

    Category: Precision Measurement and Sensing

    Received: May. 19, 2024

    Accepted: --

    Published Online: Nov. 18, 2024

    The Author Email: LIU Qian (liuqianblue@126.com)

    DOI:10.37188/OPE.20243217.2625

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