Optics and Precision Engineering, Volume. 32, Issue 17, 2625(2024)
White-light interferometry immune to vibration disturbance over wide frequency region
Fig. 3. Scanning increment calculation error with linear disturbance
Fig. 4. Scanning increment calculation error with sinusoidal disturbance
Fig. 5. Scanning increment calculation error with random disturbance
Fig. 10. Measured profiles of step (Insets are enlarged profiles circled with dashed lines)
Fig. 13. Measured step heights under sinusoidal disturbances with different amplitudes
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Qian LIU, Le MI, Xiaojin HUANG. White-light interferometry immune to vibration disturbance over wide frequency region[J]. Optics and Precision Engineering, 2024, 32(17): 2625
Category: Precision Measurement and Sensing
Received: May. 19, 2024
Accepted: --
Published Online: Nov. 18, 2024
The Author Email: LIU Qian (liuqianblue@126.com)