Acta Photonica Sinica, Volume. 46, Issue 6, 604002(2017)

Thickness Optimization and Photoelectric Performance Test of UV Sensitized Film of CMOS Sensor

LIU Qiong... MA Shou-bao, QIAN Xiao-chen, RUAN Jun, LU Zhong-rong and TAO Chun-xian |Show fewer author(s)
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    CLP Journals

    [1] Wang Guodong, Xia Guo, Li Zhiyuan, Hu Mingyong, Lu Hongbo. Design and key technology research of portable UV-VIS spectrometer[J]. Opto-Electronic Engineering, 2018, 45(10): 180195

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    LIU Qiong, MA Shou-bao, QIAN Xiao-chen, RUAN Jun, LU Zhong-rong, TAO Chun-xian. Thickness Optimization and Photoelectric Performance Test of UV Sensitized Film of CMOS Sensor[J]. Acta Photonica Sinica, 2017, 46(6): 604002

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    Paper Information

    Received: Jan. 6, 2017

    Accepted: --

    Published Online: Jun. 27, 2017

    The Author Email:

    DOI:10.3788/gzxb20174606.0604002

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