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High Power Laser and Particle Beams, Volume. 32, Issue 3, 033003(2020)

High-performance multifunctional apparatus for studying secondary electron emission characteristics of dielectric

Yun He... Jing Yang, Guanghui Miao, Na Zhang and Wanzhao Cui* |Show fewer author(s)
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  • National Key Laboratory of Science and Technology on Space Microwave, China Academy of Space Technology (Xi’an), Xi’an 710000, China
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    [2] Fukunaga K, Okamotok M T. Space charge observation in aramid/epoxy insulations under DC electric field[J]. IEEE Transaction on Components and Packing Technologies, 29, 502-507(2006).

    [4] Torregrosa G, Coves A, Vicente C. Time evolution of an electron discharge in a parallel-plate dielectric-loaded waveguide[J]. IEEE Electron Device Letters, 27, 619-621(2006).

    [5] Li Yun, Wang Dan, Yu Ming. Experimental verification of multipactor discharge dynamics between ferrite dielectric and metal[J]. IEEE Transactions on Electron Devices, 65, 4592-4599(2018).

    [6] Torregrosa-Penalva G, Coves Á, Martinez B. Multipactor susceptibility charts of a parallel-plate dielectric-loaded waveguide[J]. IEEE Transaction on Electron Devices, 57, 1160-1166(2010).

    [7] Coves Á, Torregrosa-Penalva G, Vicente C. Multipactor discharges in parallel-plate dielectric-loaded waveguides including space-charge effects[J]. IEEE Transaction on Electron Devices, 55, 2505-2511(2008).

    [8] Kate I, Mandell M, Jongeward G, et a1. The importance of accurate secondary electron yields in modeling spacecraft charging[J]. Journal of Geophysical Research, 91, 13739-13744(1986).

    [10] Song Baipeng, Shen Wenwei, Mu Haibo. Measurements of secondary electron emission from dielectric window materials[J]. IEEE Transaction on Plasma Science, 41, 2117-2122(2013).

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    Yun He, Jing Yang, Guanghui Miao, Na Zhang, Wanzhao Cui. High-performance multifunctional apparatus for studying secondary electron emission characteristics of dielectric[J]. High Power Laser and Particle Beams, 2020, 32(3): 033003

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    Paper Information

    Received: Aug. 27, 2019

    Accepted: --

    Published Online: Mar. 19, 2020

    The Author Email: Cui Wanzhao (cuiwanzhao@126.com)

    DOI:10.11884/HPLPB202032.190318

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology