Acta Optica Sinica, Volume. 35, Issue 2, 230002(2015)

Study on Influence of X-Ray Beam Spot Intensity on EDXRF Analytical Precision

Qin Xulei*, Duanmu Qingduo, Song Zhonghua, Li Ye, Li Shen, Liu Youyin, and Wang Guozheng
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    Qin Xulei, Duanmu Qingduo, Song Zhonghua, Li Ye, Li Shen, Liu Youyin, Wang Guozheng. Study on Influence of X-Ray Beam Spot Intensity on EDXRF Analytical Precision[J]. Acta Optica Sinica, 2015, 35(2): 230002

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    Paper Information

    Category: Spectroscopy

    Received: Aug. 12, 2014

    Accepted: --

    Published Online: Jan. 20, 2015

    The Author Email: Xulei Qin (qxl@cust.edu.cn)

    DOI:10.3788/aos201535.0230002

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