Acta Optica Sinica, Volume. 35, Issue 2, 230002(2015)

Study on Influence of X-Ray Beam Spot Intensity on EDXRF Analytical Precision

Qin Xulei*, Duanmu Qingduo, Song Zhonghua, Li Ye, Li Shen, Liu Youyin, and Wang Guozheng
Author Affiliations
  • [in Chinese]
  • show less

    When energy dispersive X-ray fluorescence (EDXRF) spectroscopy is used to analyze low-content element in samples with complicated background, interference from X-ray scattering will affect system detection precision, and X-ray scattering is closely related to X-ray beam spot intensity. A shimmer image intensifier is utilized to collect projection image of X-ray beam spot under different working current and the intensity of mixed and scattered ray around the projection flare is used to characterize X-ray scattering intensity, two methods to reduce X-ray beam spot intensity, i.e. reducing X-ray tube current and collimator diameter, are obtained so as to reduce the impact of the mixed and scattered ray on X-ray. It is found that when the EDXRF method is used to analyze low-content element in samples, the method of reducing collimator diameter is more effective than the method of reducing X-ray tube current for decrease of X-ray scattering, and the system detection precision can be improved when the collimator diameter is reduced and the X-ray tube current is increased meanwhile. The experimental results show that for detecting microelement Cr in the soil, actual relative error of this method is 0.9%~6.6%, and relative standard deviation is 0.7%~1.5%. p is higher than 0.05 in t test, and the test result has no significant difference with standard samples statistically.

    Tools

    Get Citation

    Copy Citation Text

    Qin Xulei, Duanmu Qingduo, Song Zhonghua, Li Ye, Li Shen, Liu Youyin, Wang Guozheng. Study on Influence of X-Ray Beam Spot Intensity on EDXRF Analytical Precision[J]. Acta Optica Sinica, 2015, 35(2): 230002

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: Spectroscopy

    Received: Aug. 12, 2014

    Accepted: --

    Published Online: Jan. 20, 2015

    The Author Email: Xulei Qin (qxl@cust.edu.cn)

    DOI:10.3788/aos201535.0230002

    Topics