Fig. 1. Schematic diagram of the measurement system

Fig. 2. Photograph of the measurement system

Fig. 3. Condition number(cond J) of Jacobian matrix for measurement system

Fig. 4. Relationship between fitting random error and azimuth angle of polarization analyzer. (a) 90° wave plate; (b) 127° wave plate

Fig. 5. Measured random power noise of light source

Fig. 6. Simulation of random error on fitting parameter errors for measurement system. (a)(b) Random error of intensity; (c)(d) random error of positioning

Fig. 7. Fitting and residual of the nonlinear response for power meter. (a)(b) Linear fitting and residual; (c)(d) nonlinear fitting and residual

Fig. 8. Measurement results of quarter wave plate sample. (a) Fitting of intensity; (b) fitting residuals of intensity in two channels; (c) sum of two channel's residual; (d) intensity change of 10 measurements

Fig. 9. Measurement results when the beam passes through the rotation center of the sample. (a) Fitting of intensity; (b) fitting residuals of intensity in two channels; (c) sum of two channel's residual; (d) intensity change of 10 measurements

Fig. 10. Correlation between residuals in the two measurement channels. (a) Before alignment; (b) after alignment