Acta Photonica Sinica, Volume. 35, Issue 7, 1052(2006)

The Relation Between The Electrode Shape and The Sensitivity of Photoconductive Ultravidet Detectors

Lü Huimin1...2,*, Chen Guangde1, and Yuan Jinshe12 |Show fewer author(s)
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  • 1[in Chinese]
  • 2[in Chinese]
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    References(10)

    [1] [1] Walker D,Zhang X,Kung P,et al. AlGaN ultraviolet photodetectors grown on sapphire. Appl Phys Lett,1996,68(15): 2100~2101

    [2] [2] Asif Khan M,Kuznia J N,Olson D T,et al. High responsivity photoconductive ultraviolet sensors based on insulating single-crystal GaN epilayers. Appl Phys Lett,1992,60(23): 2917~2919

    [3] [3] Fan L,Hao Y,Fen Q,et al. Acta Photonica Sinica,2003,32(8): 977~980

    [4] [4] Walker D. High-speed,low-noise metal-semiconductor metal ultraviolet photodetectors based on GaN. ApplPhys Lett,1999,(74): 762~767

    [5] [5] Asif Khan M,Kuznia J N,Bhattarai A R,et al. Metal semiconductor field effect transistor based on single crystal GaN. Appl Phys Lett,1993,62(15): 1786~1787

    [6] [6] Misra M. Photoconductive detectors based on partially AlxGax-1 N alloys grown by molecular beam epitaxy.Appl Phys Lett,1999,(74): 2203~2207

    [7] [7] Omnes F. Low pressure MOVPE grown AlGaN for UV photodetector applications. Materials Science and Engineering,1999,B(59): 401~404

    [8] [8] Xu H Z. Fabrication and characterization of MSM ultraviolet photodetectors on undoped GaN/Sapphire grown by MBE. J Crys Grown,2000,(218): 1~6

    [9] [9] Asif Khan M,Kuznia J N,Olson D T. Microwave performance of a 0.25 μm gate AlGaN/GaN beterostructure field effect transistor. Appl Phys Lett,1994,65(9): 1121~1123

    [10] [10] Feng Q,Duan M,HaoY. Acta Photonica Sinica,2003,32(11): 1340~1342

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    Lü Huimin, Chen Guangde, Yuan Jinshe. The Relation Between The Electrode Shape and The Sensitivity of Photoconductive Ultravidet Detectors[J]. Acta Photonica Sinica, 2006, 35(7): 1052

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    Paper Information

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    Received: Feb. 19, 2005

    Accepted: --

    Published Online: Jun. 3, 2010

    The Author Email: Lü Huimin (lvhimin618@yahoo.com.cn)

    DOI:

    CSTR:32186.14.

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