Journals Articles Conferences News About CLP
Submit a paper Email Alert
Search
Search
Articles
Journals
News
Advanced Search
Top Searches
2D MaterialsTransformation opticsQuantum PhotonicsSmall lasersSemiconductor UV PhotonicsSupersymmetric microring laser arrays

Spectroscopy and Spectral Analysis, Volume. 40, Issue 7, 2229(2020)

Influence Factors in Near-Infrared Spectrum Analysis for the Authenticity Identification of Maize Single-Kernel Varieties

ZHAO Yi-kun1... YU Yan-bo1, SHEN Bing-hui2, YANG Yong-qin1, AI Jng-min1, YAN Yan-lu3 and KANG Ding-ming1,* |Show fewer author(s)
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
    • show less
    AbstractGet PDF
    Figures&Tables (0)
    Equations (0)
    References (5)
    Tools
    Paper Information
    Topics
    References(5)

    [1] [1] Carew M E, Nichols S J, Batovska J, et al. Marine and Freshwater Research, 2017, 68(10): 1788.

    [2] [2] Mantelatto F L, Terossi M, Negri M, et al. Mitochondrial DNA Part A, 2018, 29(5): 805.

    [3] [3] Pan Y B. Agronomy, 2016, 6: 28. doi: 10.3390/agronomy6020028.

    [4] [4] Malegori C, Buratti S, Benedetti S, et al. Talanta, 2020, 206: 120208.

    [5] [5] Zhang H, Duan Z, Li Y Y, et al. Royal Society Open Science, 2019, 6(10): 191132.

    Tools

    Get Citation

    Copy Citation Text

    ZHAO Yi-kun, YU Yan-bo, SHEN Bing-hui, YANG Yong-qin, AI Jng-min, YAN Yan-lu, KANG Ding-ming. Influence Factors in Near-Infrared Spectrum Analysis for the Authenticity Identification of Maize Single-Kernel Varieties[J]. Spectroscopy and Spectral Analysis, 2020, 40(7): 2229

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Set citation alerts for article
    Save article for my favorites
    Paper Information

    Received: Jul. 2, 2019

    Accepted: --

    Published Online: Dec. 5, 2020

    The Author Email: Ding-ming KANG (kdm@cau.edu.cn)

    DOI:10.3964/j.issn.1000-0593(2020)07-2229-06

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology