Electro-Optic Technology Application, Volume. 27, Issue 6, 38(2012)
Comparison and Analysis on NETD Testing of Infrared System
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WEI Dong, XU Shi-wei, WANG Da-peng. Comparison and Analysis on NETD Testing of Infrared System[J]. Electro-Optic Technology Application, 2012, 27(6): 38
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Received: Oct. 10, 2012
Accepted: --
Published Online: Jan. 14, 2013
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CSTR:32186.14.
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