Acta Optica Sinica, Volume. 26, Issue 9, 1372(2006)

Measurement of Transient Near-Infrared Laser Pulse Wavefront with High Precision by Radial Shearing Interferometer

[in Chinese]1、*, [in Chinese]1, [in Chinese]1, [in Chinese]1, [in Chinese]2, [in Chinese]2, and [in Chinese]2
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  • 1[in Chinese]
  • 2[in Chinese]
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    References(7)

    [3] [3] P. Hariharan, D. Sen. Radial shearing interferometer[J]. Sci. Instrum., 1961, 38(11): 428~432

    [4] [4] Mitsuo Takeda. Spatial carrier heterodyne techniques for precision interferometry and profilometry [C]. Proc. SPIE, 1989, 1121: 73~80

    [5] [5] Chen Jian, Yang Yongying, Zhuo Yongmo et al.. Novel radial shearing interferometer based on spatial phase modulation[C]. Proc. the Second International Symposium Instrumentation Science and Technology, 2002, 2: 321~326

    [7] [7] Donald J. Bone, H. A. Bachor, R. John Sandeman. Fringepattern analysis using a 2D Fourier transform[J]. Appl. Opt., 1986, 25(10): 1653~1660

    [8] [8] Mitsuo Takeda,Hideki Ina, Seiji Kobayashi. Fouriertransform method of fringepattern analysis for computerbased topography and interferometry[J]. J. Opt. Soc. Am., 1982, 72: 156~160

    [11] [11] Lu Yuanbiao,Yang Yongying, Chen Yangjie et al.. Calculating Strehl ratio through radial shearing method[C]. Proc. SPIE, 2004, 5638: 428~437

    CLP Journals

    [1] Ma Haojun, Wang Guolin, Chen Dejiang, Zhang Jun, Liu Liping, Luo Jie. Experimental study on aero-optical transmission effect of infrared window in aerothermal environment[J]. Infrared and Laser Engineering, 2017, 46(9): 904001

    [2] Kong Meimei, Gao Zhishan, Chen Lei, Xu Chunsheng. Cyclic Radial Shearing Interferometry Based on Polarization Phase-Shifting Technique[J]. Acta Optica Sinica, 2010, 30(1): 127

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Measurement of Transient Near-Infrared Laser Pulse Wavefront with High Precision by Radial Shearing Interferometer[J]. Acta Optica Sinica, 2006, 26(9): 1372

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: --

    Accepted: --

    Published Online: Sep. 14, 2006

    The Author Email: (nanotesting@gmail.com)

    DOI:

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