Acta Optica Sinica, Volume. 30, Issue s1, 100301(2010)
A Method for Evaluating Life Time of Semiconductor Device Based on Electronic Speckle Pattern Interference
Figures & Tables(0)
Tools
Get Citation
Copy Citation Text
Yuan Zongheng, Song Meijie, Xiong Xianming. A Method for Evaluating Life Time of Semiconductor Device Based on Electronic Speckle Pattern Interference[J]. Acta Optica Sinica, 2010, 30(s1): 100301
Paper Information
Category: Integrated Optics
Received: Jun. 8, 2010
Accepted: --
Published Online: Dec. 13, 2010
The Author Email: Zongheng Yuan (yuanzongheng@sina.com)
© Copyright 2018-2021 | Chinese Laser Press.
All Rights Reserved 沪ICP备15018463号-20