Acta Physica Sinica, Volume. 69, Issue 15, 150601-1(2020)

Vacuum metrology based on refractive index of gas

Yu-Rong Xu1... Yang-Yang Liu1, Jin Wang1,2,*, Yu Sun1,2, Zhen-Hua Xi3, De-Tian Li3, and Shui-Ming Hu12 |Show fewer author(s)
Author Affiliations
  • 1Hefei National Laboratory for Physical Sciences at Microscale, University of Science and Technology of China, Hefei 230026, China
  • 2CAS Center for Excellence in Quantum Information and Quantum Physics, University of Science and Technology of China, Hefei 230026, China
  • 3Science and Technology on Vacuum Technology and Physics Laboratory, Lanzhou Institute of Physics, Lanzhou 730000, China
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    Yu-Rong Xu, Yang-Yang Liu, Jin Wang, Yu Sun, Zhen-Hua Xi, De-Tian Li, Shui-Ming Hu. Vacuum metrology based on refractive index of gas[J]. Acta Physica Sinica, 2020, 69(15): 150601-1

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    Paper Information

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    Received: May. 12, 2020

    Accepted: --

    Published Online: Dec. 30, 2020

    The Author Email:

    DOI:10.7498/aps.69.20200706

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