Chinese Optics Letters, Volume. 8, Issue 2, 181(2010)

Qualification of superpolished substrates for laser-gyro by surface integrated scatter measurement

Zhimeng Wei, Xingwu Long, and Kaiyong Yang
Author Affiliations
  • College of Optoelectric Science and Engineering, National University of Defense Technology, Changsha 410073, China
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    References(7)

    [1] [1] F. Aronowitz, The Laser Gyro in Laser Application (Academic Press, New York, 1971).

    [2] [2] D. R. Schmitt, Proc. SPIE 1009, 155 (1988).

    [3] [3] J. M. Bennett and L. Mattsson, Introduction to Surface Roughness and Scattering (OSA, Washington, D. C, 1999).

    [4] [4] J. C. Stover, Optical Scattering: Measurement and Analysis (Mcgraw-Hiu Press, New York, 1990).

    [5] [5] "Test methods for radiation scattered by optical components" (ISO13696, 2002).

    [6] [6] A. Hultaker, S. Gliech, N. Benkert, and A. Duparre, Proc. SPIE 5188, 115 (2003).

    [7] [7] K. D. Skeldon, J. Mackintosh, M. Gradowski, S. Thieux, and R. Lee, J. Opt. A 3, 183 (2001).

    CLP Journals

    [1] Xudong Yu, Yu Wang, Guo Wei, Pengfei Zhang, Xingwu Long. Novel temperature modeling and compensation method for bias of ring laser gyroscope based on least-squares support vector machine[J]. Chinese Optics Letters, 2011, 9(5): 051201

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    Zhimeng Wei, Xingwu Long, Kaiyong Yang. Qualification of superpolished substrates for laser-gyro by surface integrated scatter measurement[J]. Chinese Optics Letters, 2010, 8(2): 181

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    Paper Information

    Received: Aug. 15, 2009

    Accepted: --

    Published Online: Mar. 5, 2010

    The Author Email:

    DOI:10.3788/COL20100802.0181

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