Acta Photonica Sinica, Volume. 52, Issue 8, 0812004(2023)

Design and Performance Test of Low Light Level Illumination Source with Wide Dynamic Range

Yue LI, Yinlin YUAN, Yingjie YE, Deyao KONG, Lan XIAO, Wenchao ZHAI, and Xiaobing ZHENG*
Author Affiliations
  • School of Environment Science and Optoelectronic,University of Science and Technology of China,Hefei 230026,China
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    Figures & Tables(12)
    Scheme drawing of illuminance source
    Design drawing of adjustable dynamic range integrating sphere light source unit
    Mechanical design drawing of adjustable aperture
    Schematic diagram of cylinder aperture
    Adjustable aperture adjustment coefficient analysis diagram
    Adjustable aperture adjustment coefficient T (l)
    Simulation results of output illumination of low light level illuminance source
    Picture of low light level illuminance source
    Illuminance response coefficient of the monitor detector
    Test results of illuminance dynamic range
    Instability test of wide dynamic range low light illuminance source for 1 h
    • Table 1. Parameters of wide dynamic range low light level illuminance source

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      Table 1. Parameters of wide dynamic range low light level illuminance source

      ParameterValue
      Reflectivity of inner wall of integrating sphere ρ/%98
      Opening ratio of child integrating sphere f/%4.59
      Opening area of child integrating sphere/mm2176.71
      Opening ratio of parent integrating sphere f/%2.44
      Opening area of parent integrating sphere/mm2314.16
      Adjustment coefficient of adjustable aperture Tl)/%1~1.09×10-6
      Radius of input aperture of cylinder aperture a/mm2
      Radius of output aperture of cylinder aperture b/mm0.5
      Length of cylinder aperture c/mm120
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    Yue LI, Yinlin YUAN, Yingjie YE, Deyao KONG, Lan XIAO, Wenchao ZHAI, Xiaobing ZHENG. Design and Performance Test of Low Light Level Illumination Source with Wide Dynamic Range[J]. Acta Photonica Sinica, 2023, 52(8): 0812004

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Feb. 12, 2023

    Accepted: Mar. 20, 2023

    Published Online: Sep. 26, 2023

    The Author Email: ZHENG Xiaobing (xbzheng@aiofm.ac.cn)

    DOI:10.3788/gzxb20235208.0812004

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