Acta Optica Sinica, Volume. 15, Issue 12, 1601(1995)
Subfringe Integration Interferometry
We describe a subfringe integration interferometry for which the phase information is evaluated only from one interferogram. The initial phases are obtained by subfringe integration method, then the precision iteration to estimate the phase can be developed from the principle of least--squares estimation. In addition, the phase--extraction algorithm, error correction and some spplications to the measurement of the surface shape are discussed.
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[in Chinese], [in Chinese], [in Chinese]. Subfringe Integration Interferometry[J]. Acta Optica Sinica, 1995, 15(12): 1601