Fig. 1. Optical schematic diagram of measurement for waveplates

Fig. 2. Condition number（$\mathrm{c}\mathrm{o}\mathrm{n}\mathrm{d}{\left(\mathit{D}\right)}_{\mathrm{2}}$）of system matrix D

Fig. 3. Optical photograph of measurement system for waveplate

Fig. 4. The measured results of the fluctuation of the radiant intensity of the light source

Fig. 5. Simulating the variation of the waveplate's retardation error（$\mathrm{\Delta }\delta$）with retardation（$\delta$）under the influence of each single random error

Fig. 6. The influence of the combined effect of random errors on the waveplate's retardation error（$\mathrm{\Delta }\delta$）

Fig. 7. Simulation of nonlinear fitting of Waveplate's Parameters（$\tau I_{\mathrm{i}\mathrm{n}}$，$N$，${{\theta }_{\mathrm{2}}}_{\left(\mathrm{i}\mathrm{n}\mathrm{i}\mathrm{t}\mathrm{i}\mathrm{a}\mathrm{l}\right)}$）

Fig. 8. Comparison of light intensity before and after the nonlinear effect correction of the detector

Fig. 9. The nonlinear least squares fitting results of light intensity as a function of the rotation angle of the $\mathrm{1}/\mathrm{4}\lambda$ waveplate

Fig. 10. The nonlinear fitting results of measurement data of 5 groups $\mathrm{1}/\mathrm{4}\lambda$ waveplate

Fig. 11. The results of the first light intensity method to measure the retardation of $\mathrm{1}/\mathrm{4}\lambda$ and $\mathrm{0.356}\lambda$ waveplates

Fig. 12. The results of the second light intensity method to measure the retardation of $\mathrm{1}/\mathrm{4}\lambda$ and $\mathrm{0.356}\lambda$ waveplates

Fig. 13. Spectral data of white light dispersed at 630 nm~636 nm by spectrometer

Fig. 14. Nonlinear least squares fitting of the gray value of the $\mathrm{1}/\mathrm{2}\lambda$ waveplate to wavelength $\lambda$

Fig. 15. The nonlinear fitting results of spectral data of 5 groups $\mathrm{1}/\mathrm{2}\lambda$ waveplate