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Opto-Electronic Engineering, Volume. 34, Issue 1, 41(2007)

Radiation characteristic measurement of low temperature plasma under atmospheric pressure

[in Chinese] and [in Chinese]
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    [in Chinese], [in Chinese]. Radiation characteristic measurement of low temperature plasma under atmospheric pressure[J]. Opto-Electronic Engineering, 2007, 34(1): 41

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    Received: May. 10, 2006

    Accepted: --

    Published Online: Nov. 14, 2007

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    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology