Chinese Optics Letters, Volume. 6, Issue 8, 597(2008)

A method of measuring the refractive index of extraordinary ray in uniaxial crystal with optic axis at an arbitrary orientation

Yongxing Jin and Zhongxing Shao
Author Affiliations
  • Institute of Opto-Electronics, China Jiliang University, Hangzhou 310018
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    References(7)

    [1] [1] W. Feng, H. Lin, and L. Chen, Acta Opt. Sin. (in Chinese) 27, 1044 (2007).

    [2] [2] A. Yariv, Quantum Electronics (in Chinese) S. Liu, C. Wu, M. Wang (trans.) (Shanghai Scientific and Technical Press, Shanghai, 1982) p.93.

    [3] [3] Z. Shao, Phys. Rev. E 51, 1043 (1995).

    [4] [4] M. C. Simon and R. M. Echarri, Appl. Opt. 25, 1935 (1986).

    [5] [5] Z. Shao and C. Yi, Appl. Opt. 33, 1209 (1994).

    [6] [6] M. C. Simon, Appl. Opt. 22, 354 (1983).

    [7] [7] W. Shen and Z. Shao, Acta Opt. Sin. (in Chinese) 22, 765 (2002).

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    Yongxing Jin, Zhongxing Shao. A method of measuring the refractive index of extraordinary ray in uniaxial crystal with optic axis at an arbitrary orientation[J]. Chinese Optics Letters, 2008, 6(8): 597

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    Paper Information

    Received: Jan. 2, 2008

    Accepted: --

    Published Online: Sep. 2, 2008

    The Author Email:

    DOI:10.3788/COL20080608.0597

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