Acta Photonica Sinica, Volume. 46, Issue 4, 404001(2017)

Research on High Micro Element Density Silicon Photomultiplier Based on Epitaxial Quenching Resistance

JIA Jian-quan1,2、*, JIANG Jia-li1,2, LI Bai-cheng1,2, WANG Rui-heng1,2, LIANG Kun1,2, YANG Ru1,2, and HAN De-jun1,2
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  • 1[in Chinese]
  • 2[in Chinese]
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    In view of the large area of dead zone caused by the surface quenching and the contradiction between the dynamic range and the detection efficiency. By applying the epitaxial resistance quenching technology, the quenching resistance was prepared by using a substrate epitaxial layer of silicon material connected with the Avalanche Photo Diode (APD) unit. The developed Silicon Photomultiplier (SiPM) with the active area of 1×1mm2 is called F5-2 which micro cell size is 7 μm and the density of the micro element is as high as 21 488 cells/mm2. The breakdown voltage is 24.5 V; the leakage current is on 10 pA; the gain is 1.4×105; the dark count rate is about 600 kHz/mm2 and the crosstalk rate is about 10% at room temperature over bias 2.5 V; the dynamic range is about 1.8×104 cells/ mm2 and the Photon Detection Efficiency (PDE) peak value @480 nm is 16%; the recovery time is about 8.5 ns. The device has good characteristics of photon counting on account of the better single photon resolution ability. Moreover it can detect photons at the liquid nitrogen temperature which has a great potential for expanding SiPM applications such as dark matter measurements at very low temperatures.

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    JIA Jian-quan, JIANG Jia-li, LI Bai-cheng, WANG Rui-heng, LIANG Kun, YANG Ru, HAN De-jun. Research on High Micro Element Density Silicon Photomultiplier Based on Epitaxial Quenching Resistance[J]. Acta Photonica Sinica, 2017, 46(4): 404001

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    Paper Information

    Received: Oct. 12, 2016

    Accepted: --

    Published Online: May. 3, 2017

    The Author Email: Jian-quan JIA (1107509582@qq.com)

    DOI:10.3788/gzxb20174604.0404001

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