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High Power Laser and Particle Beams, Volume. 31, Issue 10, 103220(2019)

Microwave damage susceptibility trend of the silicon NPN monolithic composite transistor as a function of structure parameters

Jin Wenxuan*... Chai Changchun, Liu Yuqian, Wu Han and Yang Yintang |Show fewer author(s)
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    Jin Wenxuan, Chai Changchun, Liu Yuqian, Wu Han, Yang Yintang. Microwave damage susceptibility trend of the silicon NPN monolithic composite transistor as a function of structure parameters[J]. High Power Laser and Particle Beams, 2019, 31(10): 103220

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    Received: Jun. 17, 2019

    Accepted: --

    Published Online: Oct. 14, 2019

    The Author Email: Wenxuan Jin (wenxuan_jin@163.com)

    DOI:10.11884/hplpb201931.190218

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology