High Power Laser and Particle Beams, Volume. 31, Issue 10, 103220(2019)
Microwave damage susceptibility trend of the silicon NPN monolithic composite transistor as a function of structure parameters
Get Citation
Copy Citation Text
Jin Wenxuan, Chai Changchun, Liu Yuqian, Wu Han, Yang Yintang. Microwave damage susceptibility trend of the silicon NPN monolithic composite transistor as a function of structure parameters[J]. High Power Laser and Particle Beams, 2019, 31(10): 103220
Category:
Received: Jun. 17, 2019
Accepted: --
Published Online: Oct. 14, 2019
The Author Email: Wenxuan Jin (wenxuan_jin@163.com)