Journal of Applied Optics, Volume. 45, Issue 4, 685(2024)

Mid-infrared trap detector technology based on cryogenic integrating sphere

Xiaoyang YANG1,*... Manling SHEN2, Dahui WANG2, Pengling YANG2 and Xiangyang LI1 |Show fewer author(s)
Author Affiliations
  • 1Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China
  • 2Institute of Northwest Nuclear Technology, Xi'an 710024, China
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    Figures & Tables(22)
    Schematic diagram of cryogenic mid-infrared trap detector
    Structure and principle of integrating sphere
    Schematic diagram of micro integrating sphere structure
    Photos of experimental samples
    SRI 1000 hand-held emissivity measuring instrument
    Schematic diagram of test for specific wavelength reflection characteristics
    Schematic diagram of diffuse reflection coordinate system
    Reflet 180S BRDF test system
    Variation curves of reflected radiation intensity with test angles
    Near infrared BRDF curves of different samples
    Photos of samples used for surface testing
    Photos of surface morphology
    Pseudo-color diagram of sample surface height
    Vertical profile curves of sample surface
    Scanning electron microscope image
    Diagram of produced integrating sphere
    Variation curve of light intensity attenuation ratio of integrating sphere with reflectivity of inner cavity wall
    Spectral response curves of detector chip before and after integrating sphere installation
    Schematic block diagram of infrared detector test system
    • Table 1. Test results of wide spectrum reflectance of samples

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      Table 1. Test results of wide spectrum reflectance of samples

      样品编号宽光谱(3 μm~35 μm)反射率
      1#0.11
      2#0.95
      3#0.19
      4#0.91
      5#0.91
    • Table 2. Test results of relative reflectivity of samples

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      Table 2. Test results of relative reflectivity of samples

      样品编号光强比值(@3 800 nm)光强比值(@1 064 nm)
      1#0.003 50.029 7
      2#0.020 00.036 9
      3#0.012 00.029 4
      4#0.032 00.045 7
      5#0.029 00.042 3
    • Table 3. Electrical performance of detector chip before and after integrating sphere installation

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      Table 3. Electrical performance of detector chip before and after integrating sphere installation

      测试状态光电信号/A器件噪声/A·Hz1/2
      中波芯片1.93×10−73.5×10−12
      带积分球中波芯片1.30×10−81.0×10−12
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    Xiaoyang YANG, Manling SHEN, Dahui WANG, Pengling YANG, Xiangyang LI. Mid-infrared trap detector technology based on cryogenic integrating sphere[J]. Journal of Applied Optics, 2024, 45(4): 685

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    Paper Information

    Category: Research Articles

    Received: Sep. 27, 2023

    Accepted: --

    Published Online: Oct. 21, 2024

    The Author Email: YANG Xiaoyang (31654197@qq.com)

    DOI:10.5768/JAO202445.0401003

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