Acta Photonica Sinica, Volume. 35, Issue 6, 919(2006)

Analysis and Test on Rotation Error Induced by the Micro-displacement of Phase-shifter

Wu Xuhua*... Chen Lei and Yan Jiajun |Show fewer author(s)
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    References(8)

    [1] [1] Creath K. Phase-measurement interferometry techniques. Progress in Optics,1988,16(2) :349~393

    [2] [2] Zhu Y,Chen J B,Zhu R H,et al. Acta Photonica Sinica,1999,28(10):951~954

    [3] [3] Zhu Y,Chen J B,Zhu R H,et al. Acta Optica Sinica,2001,21(4) : 0253~2239

    [4] [4] Wu D. [Ph. D. dissertation.],Nanjing: Nanjing University of Science & Technology,2005.1

    [5] [5] Tang S. Self-calibrating five-frame algorithm for phase shifting interferometry. Proc SPIE,1996,2860:91~98

    [6] [6] Yan J J. [Ph. M. dissertation.],Nanjing: Nanjing University of Science & Technology,2004.1

    [7] [7] Malacara D,Servin M,Malacara Z. Interferogram Analysis for Optical Testing. New York: Marcel Dekker,1998.337~354

    [8] [8] Han G S,Kim S W. Numerical correction of reference phases in phase-shifting interferometry by iterative least-squares fitting. ApplOpt,1994,33(3):732~7325

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    Wu Xuhua, Chen Lei, Yan Jiajun. Analysis and Test on Rotation Error Induced by the Micro-displacement of Phase-shifter[J]. Acta Photonica Sinica, 2006, 35(6): 919

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    Paper Information

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    Received: May. 31, 2005

    Accepted: --

    Published Online: Jun. 3, 2010

    The Author Email: Xuhua Wu (wuxh1977@sina.com)

    DOI:

    CSTR:32186.14.

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