Acta Photonica Sinica, Volume. 39, Issue 11, 2025(2010)
Measure the Phase Retardation and Birefringence of the Mica Wave Plate Using the Spectroscopic Ellipsometer
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ZHANG Xu, WU Fuquan, ZHANG Xia, HAO Dianzhong, QI Limei. Measure the Phase Retardation and Birefringence of the Mica Wave Plate Using the Spectroscopic Ellipsometer[J]. Acta Photonica Sinica, 2010, 39(11): 2025
Paper Information
Received: Apr. 19, 2010
Accepted: --
Published Online: Dec. 7, 2010
The Author Email: Fuquan WU (fqwu@mail.qfnu.edu.cn)
CSTR:32186.14.
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