Acta Optica Sinica, Volume. 33, Issue s1, 114003(2013)
Lifetime Test of 808 nm High Power Laser Diodes
Figures & Tables(0)
Tools
Get Citation
Copy Citation Text
Lu Guoguang, Lei Zhifeng, Huang Yun, En Yunfei. Lifetime Test of 808 nm High Power Laser Diodes[J]. Acta Optica Sinica, 2013, 33(s1): 114003
Paper Information
Category: Lasers and Laser Optics
Received: Dec. 31, 2012
Accepted: --
Published Online: Jun. 7, 2013
The Author Email: Guoguang Lu (luguog@yahoo.com.cn)
© Copyright 2018-2021 | Chinese Laser Press.
All Rights Reserved 沪ICP备15018463号-20