Researching | Millimeter-Wave Radiation Image Deblurring Based on Residual Recursive Network

Laser & Optoelectronics Progress, Volume. 59, Issue 18, 1810011(2022)

Millimeter-Wave Radiation Image Deblurring Based on Residual Recursive Network

Guohao Xu, Yuanyuan Liu^*, and Lu Zhu

Author Affiliations

School of Information Engineering, East China Jiaotong University, Nanchang 330013, Jangxi, China

show less

Abstract Get PDF(in Chinese)

Figures&Tables (11)

References (33)

Paper Information

Figures & Tables(11)

Fig. 1. RSRN structure

Download full size

Fig. 2. Hierarchical blur extraction module structure

Download full size

Fig. 3. Structure of encoder LE

Download full size

Fig. 4. Internal structure of residual block (Res)

Download full size

Fig. 5. Structure of decoder LD

Download full size

Fig. 6. Internal structure of MSEB module

Download full size

Fig. 7. Some millimeter wave radiation image samples in dataset

Download full size

Fig. 8. Blur effect display

Download full size

Fig. 9. Visual comparison

Download full size

Table 1. Number of images in training set and test set
View table
Table 1. Number of images in training set and test set
Dataset Original dataset Preprocessed dataset
Number of images in training set 2979 5958
Number of images in test set 330 660
Total number of images 3309 6618

Table 2. Comparison of performance of different methods
View table
Table 2. Comparison of performance of different methods
Method PSNR SSIM Param /MB
SRN［^13］ 39.49 0.98738 3.76
MTRNN［^15］ 39.23 0.98737 2.64
SIUN^［32］ 35.77 0.98191 24.5
MPRNet^［33］ 35.67 0.98007 20.1
Proposed method 39.69 0.98774 2.56

Tools

Get Citation

Copy Citation Text

Guohao Xu, Yuanyuan Liu, Lu Zhu. Millimeter-Wave Radiation Image Deblurring Based on Residual Recursive Network[J]. Laser & Optoelectronics Progress, 2022, 59(18): 1810011

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites

Paper Information

Category: Image Processing

Received: Jun. 9, 2021

Accepted: Jul. 28, 2021

Published Online: Aug. 22, 2022

The Author Email: Liu Yuanyuan (lyy.78@163.com)

DOI:10.3788/LOP202259.1810011

Topics

laser devices and laser physics

Lasers and Laser Optics

laser manufacturing

Instrumentation, Measurement and Metrology