Laser & Optoelectronics Progress, Volume. 56, Issue 6, 062402(2019)

Influence of Chemical Polishing on Performances of Silicon Heterojunction Solar Cells

Yuanjian Jiang1、*, Xiaodan Zhang2, and Ying Zhao2
Author Affiliations
  • 1 College of Physics and Electronic Engineering, Heze University, Heze, Shandong 274015, China
  • 2 Key Laboratory of Optoelectronic Thin Film Devices and Technology of Tianjin City, Institute of Photo-Electronic Thin Film Devices and Technology, Nankai University, Tianjin 300071, China
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    Figures & Tables(14)
    Structural diagram of SHJ solar cell
    SEM images of pyramid profile. (a) Before isotropic etching; (b) after isotropic etching
    SEM images of silicon substrates textured by NaOH solution with mass fraction of 2% after different CP133 polishing time treatments. (a) 30 s; (b) 40 s; (c) 50 s; (d) 60 s; (e) 70 s
    Performance of solar cells as a function of chemical polishing time [w(NaOH)=2%]
    Effect of CP133 polishing time on external quantum efficiency (EQE) of solar cells [w(NaOH)=2%]
    SEM images of silicon substrates textured by NaOH solution with mass fraction of 1% after different polishing time treatments. (a) 20 s; (b) 30 s; (c) 40 s
    Performance of solar cells as a function of polishing time [w(NaOH)=1%]
    SEM images of silicon substrates textured by NaOH solutions of different concentrations after 30 s CP133 polishing treatment. (a) 2%; (b) 1%
    EQE curves for cells with optimal conversion efficiency
    • Table 1. Minority carrier lifetime and corresponding Voc-imp of texturing silicon substrates in treatment 1

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      Table 1. Minority carrier lifetime and corresponding Voc-imp of texturing silicon substrates in treatment 1

      Lifetime as-deposited /μsVocimpdeposite /VLifetime afterannealing /μsVocimpanneal /V
      1180.6681810.684
      1100.6651620.68
    • Table 2. Minority carrier lifetime and corresponding Voc-imp of texturing silicon substrates in treatment 2

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      Table 2. Minority carrier lifetime and corresponding Voc-imp of texturing silicon substrates in treatment 2

      Lifetime as-deposited /μsVocimpdeposite /VLifetime afterannealing /μsVocimpanneal /V
      677.80.721399.860.733
      495.420.7121137.940.731
    • Table 3. Effect of CP133 polishing time on minority carrier lifetime and corresponding Voc-imp of texturing silicon substrates [w(NaOH)=2%]

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      Table 3. Effect of CP133 polishing time on minority carrier lifetime and corresponding Voc-imp of texturing silicon substrates [w(NaOH)=2%]

      CP polishing time /sLifetime as-deposited /μsVocimpdeposite /VLifetime after annealing /μsVocimpanneal /V
      40143.440.653246.070.677
      50158.320.656262.050.678
      60226.370.673550.560.703
    • Table 4. Minority carrier lifetime and corresponding Voc-imp of texturing silicon substrates in treatment 3 [w(NaOH)=1%]

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      Table 4. Minority carrier lifetime and corresponding Voc-imp of texturing silicon substrates in treatment 3 [w(NaOH)=1%]

      CP polishingtime /sLifetime afterannealing /μsVocimpanneal /V
      2083.230.643
      30238.570.676
      40116.290.648
      5053.170.626
    • Table 5. Optimal performance parameters of SHJ solar cells for textured substrates prepared at different concentrations of NaOH solutions

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      Table 5. Optimal performance parameters of SHJ solar cells for textured substrates prepared at different concentrations of NaOH solutions

      Concentration of NaOH /%CP polishing time /sVocsmoothing /VFf /%η /%Jsc-QE /(mA·cm-2)
      1300.65668.816.536.5
      2600.67865.814.933.5
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    Yuanjian Jiang, Xiaodan Zhang, Ying Zhao. Influence of Chemical Polishing on Performances of Silicon Heterojunction Solar Cells[J]. Laser & Optoelectronics Progress, 2019, 56(6): 062402

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    Paper Information

    Category: Optics at Surfaces

    Received: Aug. 31, 2018

    Accepted: Oct. 19, 2018

    Published Online: Jul. 30, 2019

    The Author Email: Jiang Yuanjian (jiyjok3@sina.com)

    DOI:10.3788/LOP56.062402

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