Fig. 1. Structural diagram of W/SiO2 six-layer film sample

Fig. 2. Cross-sectional TEM image of sample in preparation state

Fig. 3. Measured and theoretical reflectance spectra of sample

Fig. 4. Physical map and infrared thermal image of sample. (a) Physical map of sample mounted on heating stage; (b) infrared thermal image of sample when heating temperature is set as 120 ℃; (c) infrared thermal image of sample when heating temperature is set as 200 ℃

Fig. 5. Measured reflectance spectra of annealed and unannealed samples