Acta Optica Sinica, Volume. 39, Issue 5, 0531001(2019)
Preparation and Characterization of Solar-Selective Absorbers Based on Multilayered W/SiO2 Thin Films
A six-layer thin-film sample constructed from the transition metal W and dielectric material SiO2 is prepared through the magnetron sputtering apparatus. The microstructure of the film is Cu(>100.0 nm)/SiO2(63.5 nm)/W(11.0 nm)/SiO2(60.0 nm))/W(5.4 nm)/SiO2(75.5 nm). The fabricated sample has a solar absorptance of 95.3% in the wavelength range of 250-2500 nm. Under the low vacuum (6 Pa) condition, the reflectance characteristics of the sample after annealing at 400 ℃ for 72 h show no obvious change, which proves that the sample has an excellent thermal stability. In addition, an infrared thermal imager is adopted for the real-time and in-situ characterization of the infrared radiation from the sample and it is proved that the sample has a low radiation characteristic. These unique properties imply that the sample is highly suited for its application in solar thermal conversion.
Get Citation
Copy Citation Text
Shuai Guo, Ying Wu, Tong Gu, Ertao Hu. Preparation and Characterization of Solar-Selective Absorbers Based on Multilayered W/SiO2 Thin Films[J]. Acta Optica Sinica, 2019, 39(5): 0531001
Category: Thin Films
Received: Dec. 14, 2018
Accepted: Jan. 23, 2019
Published Online: May. 10, 2019
The Author Email: