[1] [1] Xu X X, Chen N, Wang B, et al. Design of compact middle-wave infrared camera used on airborne platform［J］. Chinese Journal of Lasers, 2014, 41(8): 0816002.

[2] [2] Lei P, Sun K, Li H, et al. Experimental study on the change of cat eye echo pattern with laser damage of CMOS detector［J］. Chinese Journal of Lasers, 2016, 43(6): 0601001.

[3] [3] Zhang W W, Qian Y H, Chen Q, et al. Performance parameters test of electron multiplying CCD［J］. Infrared and Laser Engineering, 2013, 42(12): 3390-3395.

[4] [4] Cai J D, Liu Q, Zou Y, et al. Design of tunable light source for calibration of CMOS image sensor［J］. Acta Optica Sinica, 2017, 37(3): 0323001.

[5] [5] Wang H C, Liu H Y, Wang H F, et al. System gain calibration of CCD and evaluation of uncertainty［J］. Acta Optica Sinica, 2015, 35(s1): s112004.

[6] [6] Shang Y Y, Zhang W G, Song Y, et al. Research on evaluation method of CMOS imager［J］. Laser & Optoelectronics Progress, 2010, 47(5): 051101.

[7] [7] Li Y D, Wang B, Guo Q, et al. Testing system for radiation effects of CCD and CMOS image sensors［J］. Optics and Precision Engineering, 2013, 21(11): 2778-2784.

[8] [8] Li Z F, Li J L, Lan T J. Research of the CCD camera′s electronics gain test method［J］. Electronic Measurement Technology, 2014, 37(12): 49-52.

[9] [9] Feng J, Li Y D, Wen L, et al. Degradation mechanism for photon transfer curve of CMOS image sensor after irradiation［J］. Optics and Precision Engineering, 2017, 25(10): 2676-2681.

[10] [10] Xiu J H, Huang P, Li J, et al. Non-uniformity correction of large area array color CCD aerial mapping camera［J］. Acta Optica Sinica, 2013, 33(7): 0711003.