Laser & Optoelectronics Progress, Volume. 60, Issue 6, 0629001(2023)
Upper Limit Analysis of Measurable Particle Size by Interferometric Particle Imaging Technology
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Chunshuai Fu, Lü Qieni, Hao Liu, Taiyu Liu. Upper Limit Analysis of Measurable Particle Size by Interferometric Particle Imaging Technology[J]. Laser & Optoelectronics Progress, 2023, 60(6): 0629001
Category: Scattering
Received: Nov. 9, 2021
Accepted: Jan. 17, 2022
Published Online: Mar. 16, 2023
The Author Email: Qieni Lü (qienil@tju.edu.cn)