Semiconductor Optoelectronics, Volume. 45, Issue 5, 681(2024)

Photoconductive Impedance Nonlinearity Testing Using the Harmonic Method

HU Yue1...2, YANG Xiaoyang1 and LI Xiangyang1 |Show fewer author(s)
Author Affiliations
  • 1Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, CHN
  • 2University of Chinese Academy of Sciences, Beijing 100049, CHN
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    References(5)

    [4] [4] Khler R, Goebel R, Pello R. Experimental procedures for the comparison of cryogenic radiometers at the highest accuracy[J]. Metrologia, 1996, 33(6): 549.

    [5] [5] Martineau R J, Hu K, Manthripragada S, et al. HgCdTe detector technology and performance for the composite infrared spectrometer (CIRS)/Cassini mission[J]. Proc. of SPIE, 1996, 2803: 178-186.

    [6] [6] Krueger E E, Lee D, Miller C R, et al. HgCdTe photodiodes with cutoff wavelengths of 17 m at 70 K for use in high-resolution interferometers for remote sensing[J]. Proc. of SPIE, 1997, 3122: 355-372.

    [7] [7] Theocharous E, Ishii J, Fox N P. Absolute linearity measurements on HgCdTe detectors in the infrared region[J]. Appl. Opt., 2004, 43(21): 4182-4188.

    [8] [8] Theocharous E. Absolute linearity measurements on a PV HgCdTe detector in the infrared[J]. Metrologia, 2012, 49(2): S99.

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    HU Yue, YANG Xiaoyang, LI Xiangyang. Photoconductive Impedance Nonlinearity Testing Using the Harmonic Method[J]. Semiconductor Optoelectronics, 2024, 45(5): 681

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    Paper Information

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    Received: Mar. 24, 2024

    Accepted: Feb. 13, 2025

    Published Online: Feb. 13, 2025

    The Author Email:

    DOI:10.16818/j.issn1001-5868.2024032401

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