Acta Optica Sinica, Volume. 26, Issue 9, 1400(2006)
Study of Relation between Surface Electron Escape Probability of GaAs Photocathode and Incident Photon Wavelength
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[in Chinese], [in Chinese], [in Chinese], [in Chinese]. Study of Relation between Surface Electron Escape Probability of GaAs Photocathode and Incident Photon Wavelength[J]. Acta Optica Sinica, 2006, 26(9): 1400