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Laser & Optoelectronics Progress, Volume. 58, Issue 4, 0410010(2021)

Image Matching Algorithm for Fast Scale-Invariant Feature Transformation Based on Mask Search

Yuhao Wang*, Zetian Tang, Minzhe Zhong, Yang Wang, Guangwen Zhao, Caifu Ding, and Chen Yang*
Author Affiliations
  • College of Big Data and Information Engineering, Power Semiconductor Device Reliability Engineering Center of the Ministry of Education, Key Laboratory of Micro-Nano-Electronics and Software Technology of Guizhou Province, Guizhou University, Guiyang, Guizhou 550025, China
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    AbstractGet PDF(in Chinese)
    Figures&Tables (8)
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    References (15)
    Cited By (2)
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    Figures & Tables(8)
    Flowchart of proposed algorithm

    Fig. 1. Flowchart of proposed algorithm

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    Image partition, Mask pyramid, and feature point searching with Mask. (a) Image partition; (b) Mask pyramid; (c) feature point searching with Mask

    Fig. 2. Image partition, Mask pyramid, and feature point searching with Mask. (a) Image partition; (b) Mask pyramid; (c) feature point searching with Mask

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    Matching time, correct matching points, and seven-zone circular descriptor. (a) Matching time; (b) correct matching points; (c) seven-zone circular descriptor

    Fig. 3. Matching time, correct matching points, and seven-zone circular descriptor. (a) Matching time; (b) correct matching points; (c) seven-zone circular descriptor

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    Image matching results. (a) Brightness transformation; (b) perspective transformation; (c) fuzzy transformation; (d) rotation and scaling transformation; (e) compression transformation

    Fig. 4. Image matching results. (a) Brightness transformation; (b) perspective transformation; (c) fuzzy transformation; (d) rotation and scaling transformation; (e) compression transformation

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    Overall time of algorithm, number of feature points, and number of correct matching points. (a) Overall time of algorithm; (b) number of feature points; (c) number of correct matching points

    Fig. 5. Overall time of algorithm, number of feature points, and number of correct matching points. (a) Overall time of algorithm; (b) number of feature points; (c) number of correct matching points

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    Descriptor generation time, matching time, and number of correct matching points. (a) Descriptor generation time; (b) matching time; (c) number of correct matching points

    Fig. 6. Descriptor generation time, matching time, and number of correct matching points. (a) Descriptor generation time; (b) matching time; (c) number of correct matching points

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    Algorithms for adding extreme category in matching stage. (a) SIFT algorithm; (b) algorithm in Ref. [10]; (c) algorithm in Ref. [11]

    Fig. 7. Algorithms for adding extreme category in matching stage. (a) SIFT algorithm; (b) algorithm in Ref. [10]; (c) algorithm in Ref. [11]

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    • Table 1. Running time of different algorithms

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      Table 1. Running time of different algorithms

      MethodImageTime for finding feature points /sDescriptor generation time /sMatching time /sTotal time /s
      SIFT①1.6724.0121.2057.600
      ②2.2756.8223.17213.143
      ③2.2657.1083.17913.373
      ④2.3357.6045.79614.566
      ⑤1.8476.8502.80212.677
      Algorithm inRef. [10]①1.5031.7710.5144.453
      ②2.1073.0061.1296.877
      ③2.1033.0481.2397.147
      ④2.2173.2491.4417.626
      ⑤1.6752.6311.0816.230
      Algorithm inRef. [11]①1.6231.1000.3833.686
      ②2.2741.8580.8005.575
      ③2.2341.8022.2027.012
      ④2.3341.9362.5907.462
      ⑤1.8611.6310.7764.822
      Proposed method①1.1560.8020.2632.998
      ②1.6281.3480.4024.132
      ③1.5491.2280.3484.033
      ④1.9411.7860.5135.021
      ⑤1.5211.4930.4914.297
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    Yuhao Wang, Zetian Tang, Minzhe Zhong, Yang Wang, Guangwen Zhao, Caifu Ding, Chen Yang. Image Matching Algorithm for Fast Scale-Invariant Feature Transformation Based on Mask Search[J]. Laser & Optoelectronics Progress, 2021, 58(4): 0410010

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    Paper Information

    Category: Image Processing

    Received: Jun. 19, 2020

    Accepted: Aug. 7, 2020

    Published Online: Feb. 8, 2021

    The Author Email: Wang Yuhao (wyh920726@163.com), Yang Chen (wyh920726@163.com)

    DOI:10.3788/LOP202158.0410010

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology