Electro-Optic Technology Application, Volume. 31, Issue 2, 65(2016)
Research on Measurement Technology of Total Integral Scattering with Multi-color
References(2)
[2] [2] Amra C, Roche P, Pelletier E. Interface roughness cross-correlation laws deduced from scattering diagram measurements on optical multilayers: effect of material grain size[J]. J Opt Soc Am B, 1987, 4:1087-1093.
[3] [3] Al Jumaily G A, McNally J J, McNeil J R. Effect of ion assisted deposition on optical scatter and surface microstructure of thin films[J]. J Vac Sci Technol, 1985.
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ZHAO Xiao-chen, CAO Xue-dong, HU Ming-peng. Research on Measurement Technology of Total Integral Scattering with Multi-color[J]. Electro-Optic Technology Application, 2016, 31(2): 65
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Received: Feb. 23, 2016
Accepted: --
Published Online: Jun. 12, 2016
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CSTR:32186.14.
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