Laser & Optoelectronics Progress, Volume. 58, Issue 17, 1732001(2021)
Heavy Ion Single Event Effect Test Calibration System
Fig. 1. Structure of single event effect test calibration system
Fig. 2. 4-chip storage structure of AT68166F chip
Fig. 3. 8-region storage structure of AT60142F chip
Fig. 4. Overall structure of heavy ion single particle calibration system
Fig. 5. Heavy ion single particle calibration system plate
Fig. 6. Flip distribution of C ion irradiation at different incident angles (test data is 00). (a) Incident angle is 0; (b) incident angle is 45°; (c) incident angle is 60°
Fig. 7. Flip distribution of C ion irradiation at different incident angles (test datas is FF). (a) Incident angle is 0; (b) incident angle is 45°; (c) incident angle is 60°
Fig. 8. Single particle flip distribution of Kr ion irradiation. (a) Incident angle is 0, and test data is 00; (b) incident angle is 0, and test data is FF
|
|
|
Get Citation
Copy Citation Text
Haolin Liu, Qing Liu, Xiaohui Zhang, Jing Sun, Song Gu, Zhengyu Zhong. Heavy Ion Single Event Effect Test Calibration System[J]. Laser & Optoelectronics Progress, 2021, 58(17): 1732001
Category: Ultrafast Optics
Received: Feb. 24, 2021
Accepted: Mar. 23, 2021
Published Online: Sep. 14, 2021
The Author Email: Liu Haolin (821137104@qq.com)