Microstructure, dielectric, ferroelectric and piezoelectric properties of <inline-formula><math display="inline" overflow="scroll" xmlns:mml="http://www.w3.org/1998/Math/MathML"><msub><mrow><mtext>K</mtext></mrow><mrow><mn>0</mn><mo>.</mo><mn>4</mn><mn>5</mn></mrow></msub></math></inline-formula><inline-formula><math display="inline" overflow="scroll" xmlns:mml="http://www.w3.org/1998/Math/MathML"><msub><mrow><mtext>Na</mtext></mrow><mrow><mn>0</mn><mo>.</mo><mn>4</mn><mn>5</mn></mrow></msub></math></inline-formula><inline-formula><math display="inline" overflow="scroll" xmlns:mml="http://www.w3.org/1998/Math/MathML"><msub><mrow><mtext>Li</mtext></mrow><mrow><mn>0</mn><mo>.</mo><mn>1</mn></mrow></msub></math></inline-formula>NbO<sub>3</sub> lead-free ceramics prepared via cold sintering with post-annealing

Neng Qin; Xiao-Ming Chen; Xin-Yu Huang; Jia-Jun Lan; Yu-Ding Xu; Li-Na Liu; Han-Li Lian; Peng Liu

doi:10.1142/S2010135X24500103

Journal of Advanced Dielectrics, Volume. 15, Issue 1, 2450010(2025)

Microstructure, dielectric, ferroelectric and piezoelectric properties of $K_{0.45}$ ${Na}_{0.45}$ ${Li}_{0.1}$ NbO₃ lead-free ceramics prepared via cold sintering with post-annealing

Neng Qin... Xiao-Ming Chen*, Xin-Yu Huang, Jia-Jun Lan, Yu-Ding Xu, Li-Na Liu, Han-Li Lian** and Peng Liu |Show fewer author(s)

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Neng Qin, Xiao-Ming Chen, Xin-Yu Huang, Jia-Jun Lan, Yu-Ding Xu, Li-Na Liu, Han-Li Lian, Peng Liu. Microstructure, dielectric, ferroelectric and piezoelectric properties of $K_{0.45}$ ${Na}_{0.45}$ ${Li}_{0.1}$ NbO₃ lead-free ceramics prepared via cold sintering with post-annealing[J]. Journal of Advanced Dielectrics, 2025, 15(1): 2450010

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Paper Information

Category: Research Articles

Received: Mar. 23, 2024

Accepted: Apr. 28, 2024

Published Online: Feb. 18, 2025

The Author Email: Chen Xiao-Ming (xmchen@snnu.edu.cn), Lian Han-Li (lianhanli@163.com)

DOI:10.1142/S2010135X24500103

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology

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