Infrared and Laser Engineering, Volume. 50, Issue 5, 20200326(2021)

3D profile measurement based on depth from focus method using high-frequency component variance weighted entropy image sharpness evaluation function

Bin Liu1...2, Qian Qiao1,2, Jing Zhao1,2, Zimiao Zhang3,*, Zhiwei Li1,2, and Baofeng Zhang12 |Show fewer author(s)
Author Affiliations
  • 1Tianjin Key Laboratory of Control Theory & Applications in Complicated System, Tianjin University of Technology, Tianjin 300384, China
  • 2School of Electrical and Electronic Engineering, Tianjin University of Technology, Tianjin 300384, China
  • 3Tianjin Key Laboratory of High Speed Cutting & Precision Machining, Tianjin University of Technology and Education, Tianjin 300222, China
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    Figures & Tables(17)
    Schematic diagram of 3D profile measurement based on DFF
    Acquired image sequence
    Curves of the common image sharpness evaluation functions
    Canny operator processing result
    Flow chart of the calculation process of HCVWE function
    Curves of the proposed HCVWE and common image sharpness evaluation functions
    Schematic diagram of the sensitivity factor
    Gaussian fitting result
    Hardware system
    Standard height step
    Scanning and image acquisition process
    Measurement result of the standard step
    Distance from each upper surface point to the lower plane
    Distance from each upper surface point to the upper plane
    Distance from each lower surface point to the lower plane
    • Table 1. Quantitative evaluation indexes

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      Table 1. Quantitative evaluation indexes

      FunctionsRfsen (ε=1) fsen (ε=−1)
      Tenengrad1.5190.0090.038
      Brenner2.3380.0120.017
      Laplace1.5780.0390.007
      Roberts1.5420.0290.003
      LVE4.1150.0190.059
      HCVWE4604.6340.0250.056
    • Table 2. Data of the focusing repeatability test data (Unit: μm)

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      Table 2. Data of the focusing repeatability test data (Unit: μm)

      Scanning rangeFocusing position
      15-1350644.520
      60-1305641.414
      105-1260644.303
      150-1215645.675
      195-1170637.527
      240-1125640.032
      285-1080642.689
      330-1035639.590
      Average value641.969
      Standard deviation2.820
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    Bin Liu, Qian Qiao, Jing Zhao, Zimiao Zhang, Zhiwei Li, Baofeng Zhang. 3D profile measurement based on depth from focus method using high-frequency component variance weighted entropy image sharpness evaluation function[J]. Infrared and Laser Engineering, 2021, 50(5): 20200326

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    Paper Information

    Category: Photoelectric measurement

    Received: Sep. 7, 2020

    Accepted: --

    Published Online: Aug. 13, 2021

    The Author Email: Zhang Zimiao (zzm19850126@aliyun.com)

    DOI:10.3788/IRLA20200326

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