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Infrared and Laser Engineering, Volume. 50, Issue 5, 20200326(2021)

3D profile measurement based on depth from focus method using high-frequency component variance weighted entropy image sharpness evaluation function

Bin Liu1...2, Qian Qiao1,2, Jing Zhao1,2, Zimiao Zhang3,*, Zhiwei Li1,2, and Baofeng Zhang12 |Show fewer author(s)
Author Affiliations
  • 1Tianjin Key Laboratory of Control Theory & Applications in Complicated System, Tianjin University of Technology, Tianjin 300384, China
  • 2School of Electrical and Electronic Engineering, Tianjin University of Technology, Tianjin 300384, China
  • 3Tianjin Key Laboratory of High Speed Cutting & Precision Machining, Tianjin University of Technology and Education, Tianjin 300222, China
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    Bin Liu, Qian Qiao, Jing Zhao, Zimiao Zhang, Zhiwei Li, Baofeng Zhang. 3D profile measurement based on depth from focus method using high-frequency component variance weighted entropy image sharpness evaluation function[J]. Infrared and Laser Engineering, 2021, 50(5): 20200326

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    Paper Information

    Category: Photoelectric measurement

    Received: Sep. 7, 2020

    Accepted: --

    Published Online: Aug. 13, 2021

    The Author Email: Zhang Zimiao (zzm19850126@aliyun.com)

    DOI:10.3788/IRLA20200326

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology