Infrared and Laser Engineering, Volume. 53, Issue 5, 20230634(2024)

Dewar packaging technology of large-aperture 2 k×2 k infrared detector for cryogenic optics

Haiyong Zhu1, Zhijiang Zeng1、*, Wen Sun1,2, Zhenli Zhao1, Guangyu Fan1, Peng Ji1, Qi Zhang1, Fulong Zhuang1, and Xue Li1
Author Affiliations
  • 1State Key Laboratory of Transducer Technology, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China
  • 2University of Chinese Academy of Sciences, Beijing100049, China
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    Figures & Tables(16)
    Assembly structure design
    Dewar window spurious irradiance
    2 k×2 k medium-wave infrared cooling component
    Dewar window deformation under three working conditions
    (a)Cold platform structure A; (b) Detector noise profile of A before chiller works; (c)Detector noise profile of A after chiller works;(d)Cold platform structure B; (e) Detector noise profile of B before chiller works;(f)Detector noise profile of B after chiller works
    Detector module
    Chiller load and power curve
    Platinum-iridium wire bonded sample
    Mechanical test diagram of components
    • Table 1. The general technical requirements of IDDCA for the 2 k×2 k

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      Table 1. The general technical requirements of IDDCA for the 2 k×2 k

      ItemCharacteristics
      Detection pixel2048×2048
      Operating temperature/K70
      Dewar leaks heat/W<1.1
      Weight/kg<1.5
      Temperature uniformity/K<0.5
      Temperature fluctuation/K<0.5
      NETD/mK≤25
    • Table 2. Variation of the system MTF of three fields at Nyquist frequency

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      Table 2. Variation of the system MTF of three fields at Nyquist frequency

      MTF at 27.78 lp/mmAxial field of view0.7 field of viewFull field of view
      MeridianSagittalMeridianSagittalMeridianSagittal
      Original0.6977720.6977720.7010270.7010270.6822660.682266
      Condition 10.6977670.6977530.7010180.7010140.6822710.682312
      Condition 20.6971210.6972450.7009540.7010340.6823420.682134
      Condition 30.6969560.6971450.7004320.7011650.6824620.681845
    • Table 3. Variation of wavefront error of primary wavelength based on deformation effect

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      Table 3. Variation of wavefront error of primary wavelength based on deformation effect

      RMS of wavefront errorAxial field of view0.7 field of viewFull field of view
      Without deformation/λ0.02140.01730.0137
      Condition 1/λ0.02140.01730.0141
      Condition 2/λ0.02320.01810.0134
      Condition3/λ0.02410.01850.0152
    • Table 4. Probe temperature fluctuates in 5 min

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      Table 4. Probe temperature fluctuates in 5 min

      NumberDetector operating temperature/KTemperature flucuation/K
      1700.061
      2700.064
      3700.077
      4700.077
      5700.084
    • Table 5. Properties of bonded materials

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      Table 5. Properties of bonded materials

      Bonded wire materialAverage thermal conductivity/W·(m·K)−1Average resistivity/×10−8 Ω·mTensile strength/MPa
      Au311.421.35180-270
      Aluminum-silicon wire276.291.52160-250
      Platinum wire71.610.6500-800
      Platinum-iridium wire (10% iridium)26.522.5870-1025
    • Table 6. Test conditions of vibration test

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      Table 6. Test conditions of vibration test

      Sinusoidal vibration in X, Y and Z directions
      Frequency/Hz5-11.411.4-2525-8080-100
      Magnitude of vibration15 mm (O-P)7.9 g17.9 g18 g
      Stochastic vibration in X, Y and Z directions
      Frequency/Hz20-8080-350350-2 000
      Power spectrum density+3 dB/oct0.04 g2/Hz−3 dB/oct
      Acceleration root-mean-square values6.06 g
    • Table 7. Main performance indicators

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      Table 7. Main performance indicators

      ItemValueItemValue
      Detector structure2 k×2 kInhomogeneity<10%
      Photosensitive element size/mm0.018×0.018Dewar leaks heat/mW842
      Waveband/μm2.5-5.0Dewar weight/kg1.32
      Band detection rate/cm·Hz1/2·W−1Dp*> 5E11 (70 K)Noise equivalent temperature difference/mK<20
      Temperature uniformity/K0.1 (70 K)Temperature fluctuation<0.1
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    Haiyong Zhu, Zhijiang Zeng, Wen Sun, Zhenli Zhao, Guangyu Fan, Peng Ji, Qi Zhang, Fulong Zhuang, Xue Li. Dewar packaging technology of large-aperture 2 k×2 k infrared detector for cryogenic optics[J]. Infrared and Laser Engineering, 2024, 53(5): 20230634

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    Paper Information

    Category:

    Received: Nov. 13, 2023

    Accepted: --

    Published Online: Jun. 21, 2024

    The Author Email: Zeng Zhijiang (jonzeng@mail.sitp.ac.cn)

    DOI:10.3788/IRLA20230634

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