Spectroscopy and Spectral Analysis, Volume. 45, Issue 3, 616(2025)

A Method for Classifying Stains and Defects on Mobile Phone Cover Glass Based on Hyperspectral Line Scan Imaging

SHEN Guan-ting1... RAO Ke-yi1, FANG Rui-xin1, ZHANG Xue-min1, and WU Zhao-cong12,* |Show fewer author(s)
Author Affiliations
  • 1School of Remote Sensing Information Engineering,Wuhan University, Wuhan430072, China
  • 2Aerospace Information Research Institute, Henan Academy of Sciences, Zhengzhou450046, China
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    References(7)

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    [8] [8] Takhar G, Prakash C, Mittal N, et al. Comparative Analysis of Background Subtraction Techniques and Application, International Conference on Recent Advances & Innovations in Engineering IEEE, 2017.

    [9] [9] Zhang Z, Xu Y, Yang J, et al. IEEE Access, 2015, 3: 490.

    [10] [10] Li D, Liang L Q, Zhang W J, et al. The International Journal of Advanced Manufacturing Technology, 2014, 73(9): 1605.

    [11] [11] Tsai D M, Tseng Y H, Fan S K M. Defect Inspection of Liquid-Crystal-Display (LCD) Panels in Repetilive Pattern Images Using 2D Fourier Image Reconstruction, International Conference on Autonomic and Autonomous Systems, 2018.

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    SHEN Guan-ting, RAO Ke-yi, FANG Rui-xin, ZHANG Xue-min, WU Zhao-cong. A Method for Classifying Stains and Defects on Mobile Phone Cover Glass Based on Hyperspectral Line Scan Imaging[J]. Spectroscopy and Spectral Analysis, 2025, 45(3): 616

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    Paper Information

    Received: Nov. 14, 2023

    Accepted: Mar. 24, 2025

    Published Online: Mar. 24, 2025

    The Author Email: WU Zhao-cong (zcwoo@whu.edu.cn)

    DOI:10.3964/j.issn.1000-0593(2025)03-0616-07

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