Advanced Photonics, Volume. 4, Issue 6, 064001(2022)

Silicon nitride-based Kerr frequency combs and applications in metrology

Zhaoyang Sun1, Yang Li1、*, Benfeng Bai1、*, Zhendong Zhu2, and Hongbo Sun1、*
Author Affiliations
  • 1Tsinghua University, State Key Laboratory of Precision Measurement and Instruments, Department of Precision Instrument, Beijing, China
  • 2National Institute of Metrology, Beijing, China
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    Zhaoyang Sun, Yang Li, Benfeng Bai, Zhendong Zhu, Hongbo Sun. Silicon nitride-based Kerr frequency combs and applications in metrology[J]. Advanced Photonics, 2022, 4(6): 064001

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    Paper Information

    Category: Reviews

    Received: Aug. 7, 2022

    Accepted: Oct. 20, 2022

    Posted: Oct. 20, 2022

    Published Online: Nov. 15, 2022

    The Author Email: Li Yang (yli9003@mail.tsinghua.edu.cn), Bai Benfeng (baibenfeng@tsinghua.edu.cn), Sun Hongbo (hbsun@tsinghua.edu.cn)

    DOI:10.1117/1.AP.4.6.064001

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