Optoelectronics Letters, Volume. 18, Issue 11, 699(2022)
Wavelet based deep learning for depth estimation from single fringe pattern of fringe projection profilometry
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ZHU Xinjun, HAN Zhiqiang, SONG Limei, WANG Hongyi, WU Zhichao. Wavelet based deep learning for depth estimation from single fringe pattern of fringe projection profilometry[J]. Optoelectronics Letters, 2022, 18(11): 699
Received: May. 19, 2022
Accepted: Aug. 7, 2022
Published Online: Jan. 20, 2023
The Author Email: Xinjun ZHU (xinjunzhu@tiangong.edu.cn)