Applications of thickness measurement method based on terahertz time-of-flight in atmospheric environment

Wulin GONG; Zhanfeng LI; Quancheng LIU; Hu DENG; Zhixiang WU

doi:10.5768/JAO202344.0403001

Journal of Applied Optics, Volume. 44, Issue 4, 809(2023)

Applications of thickness measurement method based on terahertz time-of-flight in atmospheric environment

Wulin GONG1...3, Zhanfeng LI1,3, Quancheng LIU2,3,*, Hu DENG2,3, and Zhixiang WU23 |Show fewer author(s)

¹School of Manufacturing Science and Engineering, Southwest University of Science and Technology, Mianyang 621010, China

²School of Information Engineering, Southwest University of Science and Technology, Mianyang 621010, China

³Tianfu Institute of Research and Innovation, Southwest University of Science and Technology, Chengdu 610299, China

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Figures & Tables(8)

Fig. 1. Schematic diagram of measurement principle

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$Absorption coefficient and refractive index of water vapor under different humidity$

Fig. 2. Absorption coefficient and refractive index of water vapor under different humidity

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Fig. 3. Comparison diagram of dry air and wet air

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Fig. 4. Time-domain spectrogram of samples in atmospheric environment

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Fig. 5. Amplitude-frequency diagram of samples

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Fig. 6. Time-domain spectrogram of reconstructed signal from samples

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Table 1. Comparison of wave peak position of reconstructed signal

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Table 1. Comparison of wave peak position of reconstructed signal

样品	潮湿空气主波峰位置/ps	样品信号	样品主波峰位置/ps	样品回波峰位置/ps	千分尺测量的厚度/mm
PE	20.381	干燥环境	26.048	58.248	3.128
PE		重构	26.048	58.281	3.128
PP		干燥环境	25.548	55.915	3.002
PP		重构	25.548	55.915	3.002

Table 2. Thickness calculation of signal and reconstructed signal of samples in dry environment

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Table 2. Thickness calculation of signal and reconstructed signal of samples in dry environment

样品	样品信号	Δt₁/ps	Δt₂/ps	折射率	厚度/mm	绝对误差/mm	相对误差/%
PE	干燥环境	5.667	32.200	1.543	3.130	0.002	0.064
PE	重构	5.667	32.233	1.542	3.135	0.007	0.224
PP	干燥环境	5.167	30.367	1.516	3.005	0.003	0.100
PP	重构	5.167	30.367	1.516	3.005	0.003	0.100

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Wulin GONG, Zhanfeng LI, Quancheng LIU, Hu DENG, Zhixiang WU. Applications of thickness measurement method based on terahertz time-of-flight in atmospheric environment[J]. Journal of Applied Optics, 2023, 44(4): 809

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