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Acta Optica Sinica, Volume. 25, Issue 6, 781(2005)

Fringe Analysis with Hilbert Transform and Its Application in the Measurement of Aspheric Mirror

[in Chinese]1,2、*, [in Chinese]1, [in Chinese]1, and [in Chinese]3
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    [1] [1] N. A. Massie, R. D. Nelson, S. Holly. High-performance real-time heterodyne interferometry[J]. Appl. Opt., 1979, 18(11): 1797～1803

    [2] [2] Y. Ishii, J. Chen, K. Murata. Digital phase-measuring interferometry with a tunable laser diode[J]. Opt. Lett., 1987, 12(4): 233～235

    [3] [3] M. Takeda, H. Ina, S. Kobayashu. Fourier-transform method of fring-pattern analysis for computer-based topography and interfermetry[J]. J. Opt. Soc. Am., 1982, 72(1): 156～160

    [4] [4] M. Sticker, C. K. Hitzenberger, R. Leitgeb et al.. Quantitative differential phase measurement and imaging in transparent and turbid media by optical coherence tomography[J]. Opt. Lett., 2001, 26(8): 518～520

    [5] [5] Hiroto Watanabe, Ribun Onodera, Yukihiri Ishii. Demodulation technique for interferometric phase with a one-dimensional deicrete Hilbert transform[C]. Proc. SPIE, 2002, 4919: 376～383

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    [2] Li Sikun, Su Xianyu, Chen Wenjing. Applications of Two-Dimensional Wavelet Transform on Phase Analysis of Spatial Carrier-Fringe Patterns[J]. Acta Optica Sinica, 2010, 30(6): 1673

    [3] Li Xiangyu, Huang Zhanhua, Zhu Meng, Zhang Hao, Li Xiuming. Measurement of Transient Deformation Using High-Speed Temporal Speckle Pattern Interferometry[J]. Acta Optica Sinica, 2015, 35(6): 612002

    [4] Luo Feng, Chen Wenjing, Su Xianyu. Improve Measurement Range and Accuracy of Fourier Transform Profilometry by Hilbert Transform[J]. Laser & Optoelectronics Progress, 2015, 52(11): 110701

    [5] Liu Yuankun, Su Xianyu, Zhang Qican. A Novel Phase Order Self-Encoding Technique for Phase Measuring Profilometry[J]. Acta Optica Sinica, 2011, 31(11): 1111002

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Fringe Analysis with Hilbert Transform and Its Application in the Measurement of Aspheric Mirror[J]. Acta Optica Sinica, 2005, 25(6): 781

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Jan. 17, 2004

    Accepted: --

    Published Online: May. 22, 2006

    The Author Email: (lvjie219@163.com)

    DOI:

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology