Journals Articles Conferences News About CLP
Submit a paper Email Alert
Search
Search
Articles
Journals
News
Advanced Search
Top Searches
2D MaterialsTransformation opticsQuantum PhotonicsSmall lasersSemiconductor UV PhotonicsSupersymmetric microring laser arrays

Laser & Optoelectronics Progress, Volume. 58, Issue 19, 1900003(2021)

Failure Mechanism and Detection Analysis of Semiconductor Laser

Tianyu Sun1, Mingjun Xia1、*, and Lei Qiao2
Author Affiliations
  • 1College of Information Science & Electronic Engineering, Zhejiang University, Hangzhou , Zhejiang 310027, China
  • 2ZTE Corporation, Shenzhen , Guangdong 518057, China
    • show less
    AbstractGet PDF(in Chinese)
    Figures&Tables (10)
    Equations (0)
    References (68)
    Cited By (7)
    Tools
    Paper Information
    Topics
    Cited By

    Article index updated:Jun. 3, 2024

    Citation counts are provided from Researching.
    The article is cited by 7 article(s) from Researching.
    Tools

    Get Citation

    Copy Citation Text

    Tianyu Sun, Mingjun Xia, Lei Qiao. Failure Mechanism and Detection Analysis of Semiconductor Laser[J]. Laser & Optoelectronics Progress, 2021, 58(19): 1900003

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Set citation alerts for article
    Save article for my favorites
    Paper Information

    Category: Reviews

    Received: Jan. 14, 2021

    Accepted: Mar. 2, 2021

    Published Online: Sep. 29, 2021

    The Author Email: Xia Mingjun (xiamingjun@zju.edu.cn)

    DOI:10.3788/LOP202158.1900003

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology