Laser & Optoelectronics Progress, Volume. 58, Issue 19, 1900003(2021)
Failure Mechanism and Detection Analysis of Semiconductor Laser
As semiconductor lasers have excellent characteristics including wide output wavelength range, simple structure, and easy to be integrated, they are widely used in medical, sensing, optical communications, military, and aerospace fields. With the increase of application requirements and output optical power, the reliability of lasers suffers from severe challenges. This paper reviews the failure mechanism of semiconductor lasers and analyzes the five effective failure detection and analysis methods of photoluminescence technology, electroluminescence technology, cathodoluminescence technology, infrared thermal imaging, and emission microscope. Furthermore, this paper summarizes and suggests the improvement measurements of the failure induced by the active area, cavity surface, welding, and operating environment. These will provide effective suggestions for the research and production of semiconductor lasers.
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Tianyu Sun, Mingjun Xia, Lei Qiao. Failure Mechanism and Detection Analysis of Semiconductor Laser[J]. Laser & Optoelectronics Progress, 2021, 58(19): 1900003
Category: Reviews
Received: Jan. 14, 2021
Accepted: Mar. 2, 2021
Published Online: Sep. 29, 2021
The Author Email: Xia Mingjun (xiamingjun@zju.edu.cn)